Keithley 6221/2182A AC and DC Current Source with Nanovoltmeter

Overview

When connected together, the Model 2182A Nanovoltmeter and Model 6221 AC and DC Current Source can be operated as a single integrated instrument. This complete Delta Mode system is ideal for resistance measurements, pulsed I-V measurements, and differential conductance measurements, providing significant advantages over other solutions. The system is well suited for nanotechnology applications because it can measure resistance without dissipating significant power in the device under test, which would otherwise invalidate results or destroy the sample.

Model 6221 AC and DC Current Source Features

• Source and sink (programmable load) from 100fA to 100mA
• High output impedance ensures stable current sourcing into variable loads
• Source AC currents from 2pA to 100mA for AC characterization of components and materials
• 10MHz output update rate generates smooth sine waves up to 100kHz
• 65,000-point source memory allows executing comprehensive test current sweeps
• Reconfigurable triax output simplifies guarding requirements
• Model 220 emulation mode eliminates need to reprogram existing applications
• Built-in Ethernet interface for remote control

Model 2182A Nanovoltmeter Features

• 1 nV resolution on 10.000000 mV range
• 40-50nV peak-to-peak noise at 60ms response time
• Synchronization to line provides 110dB NMRR and minimizes AC common-mode current effects
• Dual channels support measuring voltage, temperature, or resistance ratios
• Thermocouple linearization with 8 types and cold junction compensation
• GPIB and RS-232 interfaces

Key Capabilities

• Measure resistances from 10nΩ to 100MΩ
• Synchronized current-pulsed source and measurement times as short as 50μs
• Delta mode current reversal technique for accurate ultra-low resistance measurements
• Differential conductance measurements at speeds 10x faster than other methods
• Minimal current transients in delta, differential conductance, and pulse modes

Applications

• Hall effect measurements on semiconductor materials
• Precision resistance measurements using delta mode
• Pulsed I-V characterization with minimal power dissipation
• Differential conductance measurements on non-linear devices
• Ultra-low resistance characterization of nanomaterials and superconductors
• Low-power device testing in nanotechnology research