Keithley KTH 2470 SourceMeter Instrument

Overview

The Keithley KTH 2470 SourceMeter Instrument is a next-generation source measure unit (SMU) that combines precision measurement capability up to 1100V, 1A, 20W with an intuitive capacitive touchscreen interface. Optimized for characterizing and testing high-voltage, low-leakage devices such as silicon carbide (SiC), gallium nitride (GaN), power MOSFETs, and power modules, the 2470 leverages decades of Keithley expertise to deliver both precision and ease of use in laboratory and test rack environments.

Key Features

• 0.012% basic measure accuracy with 6½-digit resolution
• 1100V / 1A DC maximum capability with 10 fA measure resolution
• Five-inch color capacitive touchscreen with icon-based menu structure
• Four-quadrant source and sink operation
• Multiple programming modes: TSP scripting and 2450 SCPI compatibility
• Built-in context-sensitive help reducing setup steps by 50%
• Front panel banana jacks and rear panel triaxial connections
• Comprehensive connectivity: GPIB, USB 2.0, LXI/Ethernet, D-sub 9-pin digital I/O

Applications

• Characterization of silicon carbide (SiC) and gallium nitride (GaN) semiconductor devices
• Power MOSFET and transient suppression device testing
• Circuit protection device and power module evaluation
• Battery and materials testing with high-voltage, low-leakage requirements
• I-V characterization and device parametric testing

Included Accessories

• High performance test leads
• USB Type B to Type A cable
• CS-1616-3 safety interlock mating connector
• CA-180-3A TSP-Link/Ethernet cable
• Quick start guide and downloadable documentation