Hioki 3504-60 C Hi-Tester

Overview

The Hioki 3504-60 is the most advanced model in the 3504 C Hi-Tester series, designed for high-reliability testing and component sorting. It features 2 ms measurement speed and can detect contact failure on all 4 terminals, ensuring reliable testing results and increased yield. The device combines constant voltage testing capability with binning functionality (up to 14 ranks) and GP-IB interface connectivity for seamless integration into automated test systems.

Key Features

• High-speed measurement at 2 ms
• Contact failure detection on all 4 terminals for enhanced reliability
• Constant voltage testing (CV) for C measurements with voltage dependency characteristics
• Binning function with up to 14 classification ranks
• Memory for 99 sets of measurement conditions
• GP-IB interface for system integration
• Continuous contact error monitoring during measurement
• Trigger-synchronous output function

Applications

• High-reliability component testing and sorting
• Production line integration for advanced testing
• Quality assurance in demanding manufacturing environments