Hioki 3504-50 C Hi-Tester
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Hioki 3504-50 is a C Hi-Tester with GP-IB interface and binning function, featuring 2 ms measurement speed and constant voltage capability.
Product details
| Model | 3504-50 |
| Manufacturer | Hioki |
| Category | Electrical Testers |
| Availability | Made to order |
Description
Overview
The Hioki 3504-50 is a versatile C Hi-Tester designed for component testing and sorting applications. It features constant voltage measurement capability (1V or 500mV), making it suitable for testing components with voltage-dependent characteristics. The device includes GP-IB interface connectivity for integration with automated test systems and a binning function for component sorting with up to 14 classification ranks.
Key Features
- Fast minimum measurement time of 2 ms
- Constant voltage measurement at 1V or 500mV
- Binning function with up to 14 classification ranks
- Memory for 99 sets of measurement conditions
- GP-IB interface for system integration
- LED indication and simple operation
- Trigger-synchronous output function
Applications
- Component sorting and classification
- Production line integration and automated testing
- Quality assurance and component verification
Specifications
| Measurement Speed | 2 ms |
| Measurement Voltage | 1V or 500mV |
| Binning Ranks | Up to 14 |
| Condition Memory | 99 sets |
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Hioki 3504-50 C Hi-Tester
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