Siglent SDS6058L Digital Storage Oscilloscope

Overview

The Siglent SDS6058L is an 8-channel digital storage oscilloscope in the SDS6000L low-profile series, designed for applications requiring simultaneous capture of multiple signals. With 500MHz bandwidth, 5 GSa/s sample rate, and 500 Mpts record length, it provides detailed multi-signal analysis in a compact form factor.

Key Features

• 8 analog channels plus 1 external trigger, expandable to multi-unit 512-channel systems
• 500MHz bandwidth with 5 GSa/s sample rate (10 GSa/s ESR) per channel
• Low background noise with vertical scales from 0.5 mV/div to 10 V/div
• SPO technology with up to 170,000 waveforms/s capture (normal mode) and 750,000 wfm/s (sequence mode)
• 256-level intensity grading and color temperature display modes
• 500 Mpts total record length
• Intelligent trigger modes: Edge, Slope, Pulse, Window, Runt, Interval, Dropout, Pattern, Qualified, Nth edge, Setup/hold, Delay, and Video (HDTV)
• Serial bus triggering and decoding: I2C, SPI, UART, CAN, LIN, CAN FD, FlexRay, I2S, MIL-STD-1553B, SENT, Manchester
• Segmented acquisition (Sequence) mode with up to 80,000 segments and minimal dead time
• History waveform recording up to 80,000 frames
• Over 50 automatic measurements with histogram, track, trend, and gating analysis
• 4 Math traces with 8 Mpts FFT and formula editor support
• Advanced analysis: Search, Navigate, Digital Voltmeter, Counter, Waveform Histogram, Power Analysis, Eye/Jitter Analysis
• Optional 16 digital channels for mixed-signal analysis
• 25 MHz arbitrary waveform generator with multiple predefined waveforms
• Interfaces: 4x USB Host, USB Device (USBTMC), 1000M LAN (VXI-11/Telnet/Socket), micro SD, Pass/Fail, Trigger Out, HDMI, 10MHz In/Out
• Built-in web server and SCPI support for remote control and automated testing

Applications

• Multi-channel signal monitoring and analysis
• Complex circuit debugging with simultaneous channel capture
• Serial protocol debugging across multiple signal lines
• Power electronics and signal integrity testing
• Automated test systems via SCPI
• Multi-unit high-speed acquisition systems