Microsemi 53100A Phase Noise Analyzer
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Microsemi 53100A measures amplitude, phase, and frequency stability of RF sources from 1 MHz to 200 MHz with advanced SSB phase noise and Allan deviation measurements.
Product details
| Model | 53100A |
| Manufacturer | Microsemi |
| Category | RF & Microwave Test Equipment |
| Availability | Made to order |
Description
Overview
The Microsemi 53100A is a precision oscillator characterization instrument that measures the amplitude, phase, and frequency stability of high-performance RF sources. Supporting carrier frequencies from 1 MHz to 200 MHz, it provides comprehensive stability analysis at timescales ranging from femtoseconds to days, making it suitable for both bench-top and embedded rack-mount ATE systems.
Key Features
- Allan deviation (ADEV) typically less than 5E-15 at t=1s, 1E-16 at t=1000s
- Modified Allan deviation (MDEV), Hadamard deviation (HDEV), and time deviation (TDEV)
- Single side band (SSB) phase noise and AM noise measurements at offsets from 0.001 Hz to 1 MHz, typically below -175 dBc/Hz
- RMS-integrated time jitter, residual FM, and SSB carrier/noise ratio
- Independent input and reference frequencies from 1 to 200 MHz
- No phase-locking or measurement calibration required
- Single or dual reference oscillator inputs for cross-correlation measurements
- TSC 51XXA command and data stream emulation for legacy test script compatibility
- Intuitive graphical user interface
- Measurements beyond 200 MHz supported with external down-conversion
Applications
- Oscillator characterization and validation
- RF source frequency stability testing
- High-precision frequency counter applications
Specifications
| Frequency Range | 1 MHz to 200 MHz |
| Allan Deviation (ADEV) at 1s | < 5E-15 |
| Allan Deviation (ADEV) at 1000s | 1E-16 |
| Phase Noise Floor | Typically -175 dBc/Hz |
| Offset Range for Phase Noise | 0.001 Hz to 1 MHz |
| Measurements Supported | SSB phase noise, AM noise, MDEV, HDEV, TDEV, time jitter, residual FM |
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Microsemi 53100A Phase Noise Analyzer
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