Tektronix SUP6-WBG-DPT Wide Bandgap SiC GaN Double Pulse Test
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SUP6-WBG-DPT is a wide bandgap SiC/GaN double pulse test application for Tektronix 6 Series MSO, optimized for power semiconductor characterization.
Product details
| Model | SUP6-WBG-DPT |
| Manufacturer | Tektronix |
| Category | Oscilloscope Accessories |
| Availability | Made to order |
Description
Overview
The Tektronix SUP6-WBG-DPT Wide Bandgap SiC GaN Double Pulse Test application extends the Tektronix 6 Series MSO oscilloscope with specialized tools for analyzing wide bandgap semiconductor devices. This software module implements standard double pulse test methodologies, enabling engineers to characterize switching performance, losses, and dynamics of Silicon Carbide and Gallium Nitride power semiconductors.
Key Features
- Double pulse test framework for wide bandgap devices
- Automated switching loss measurement and analysis
- Gate drive and switching performance characterization
- Integrated thermal analysis support
- SiC and GaN device parameter extraction
Applications
- Wide bandgap semiconductor device characterization
- Power conversion system development and optimization
- Switching loss analysis and efficiency improvement
- Power electronics reliability and qualification testing
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Tektronix SUP6-WBG-DPT Wide Bandgap SiC GaN Double Pulse Test
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