Tektronix SUP5-WBG-DPT Wide Bandgap SiC GaN Double Pulse Test Application
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Tektronix SUP5-WBG-DPT double pulse test application for characterizing and analyzing wide-bandgap SiC and GaN semiconductor devices on MSO 5 Series oscilloscopes.
Product details
| Model | SUP5-WBG-DPT |
| Manufacturer | Tektronix |
| Category | Oscilloscope Accessories |
| Availability | Made to order |
Description
Overview
The Tektronix SUP5-WBG-DPT is a measurement application designed for the MSO 5 Series oscilloscope platform, enabling comprehensive characterization of wide-bandgap (WBG) semiconductor devices including silicon carbide (SiC) and gallium nitride (GaN) components. The double pulse test (DPT) methodology provides accurate evaluation of device performance, switching behavior, and thermal characteristics essential for power electronics development.
Key Features
- Double pulse test methodology for comprehensive device characterization
- Support for SiC and GaN wide-bandgap semiconductor devices
- Integrated analysis tools for switching behavior and performance metrics
- Seamless integration with MSO 5 Series oscilloscope platform
Applications
- Wide-bandgap semiconductor device characterization and validation
- Power converter and inverter development
- Switching device performance evaluation
- Power electronics research and development
Specifications
| Application Type | Double Pulse Test (DPT) |
| Compatible Devices | SiC and GaN Wide-Bandgap Semiconductors |
| Compatible Platform | MSO 5 Series Oscilloscopes |
| License Type | NL (Non-Limited) |
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Tektronix SUP5-WBG-DPT Wide Bandgap SiC GaN Double Pulse Test Application
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