Tektronix 5-DJA Advanced Jitter and Eye Diagram Analysis

Overview

The Tektronix 5-DJA Advanced Jitter and Eye Diagram Analysis option provides industry-leading sensitivity and accuracy for signal integrity analysis in real-time oscilloscopes. Based on the proven Tektronix DPOJET eye-diagram and jitter analysis package, this option integrates comprehensive jitter measurement and analysis directly into the oscilloscope's automatic measurement system. It simplifies identification of signal integrity concerns and jitter sources in high-speed serial, digital, and communication system designs.

Key Features

• Basic timing measurements including period, frequency, rise/fall times, pulse width, and duty cycle
• Time Interval Error (TIE) and phase noise analysis
• Graphical tools including histograms, time trends, and spectrum displays
• Programmable software clock recovery with configurable PLL
• Selectable high- and low-pass measurement filters
• Real-time eye-diagram analysis with automatic bit rate and pattern detection
• Advanced jitter decomposition using spectral and Q-scale methods
• Dual-Dirac model parameter extraction for industry-standard jitter analysis
• Bounded uncorrelated jitter (BUJ) algorithms for precise Total Jitter measurements
• Eye diagram mask testing and bathtub curve analysis
• Multiple plot types: time trend, eye diagram, histogram, spectrum, bathtub curve, and SSC profile

Applications

• Quantify signal amplitude and timing parameters with margin analysis
• Debug complex embedded systems and high-speed interfaces
• Characterize high-speed serial and parallel bus designs
• Measure clock and data jitter/noise and assess signal integrity
• Characterize PLL dynamic performance
• Analyze spread spectrum clock circuit modulation
• Evaluate jitter generation, transfer, and tolerance in system designs