Keysight B2911A Source Measure Unit
Keysight B2911A single-channel source/measure unit with 210V maximum voltage, 3A DC and 10.5A pulse current, 10 fA/100 nV resolution for semiconductor testing.
Product details
| Model | B2911A |
| Manufacturer | Keysight |
| Category | LCR & Impedance Analyzers |
| Availability | Made to order |
Description
Overview
The Keysight B2911A is a compact single-channel precision source/measure unit designed for versatile IV measurement tasks requiring high accuracy and resolution. It provides a wide output range of ±210 V, ±3 A DC, and ±10.5 A pulsed capability with measurement resolution as fine as 10 fA for current and 100 nV for voltage. The integrated four-quadrant sourcing and measurement capabilities enable accurate electrical characterization of a wide variety of devices without requiring multiple instruments or complex setups.
The unit features an intuitive 4.3-inch color LCD display with graphical and numerical view modes, allowing quick setup and data visualization directly from the front panel. Built-in arbitrary waveform generation and digitizing capabilities with 10 microsecond intervals provide extensive flexibility for dynamic electrical characterization. Multiple software control options and SCPI command support enable seamless integration into automated test environments and support for conventional SMU command compatibility.
Key Features
- Single-channel configuration with 4-quadrant sourcing and measurement
- Maximum 210 V output, 3 A DC / 10.5 A pulse current
- 10 fA/100 nV source and measurement resolution
- Integrated 4-quadrant voltage and current capabilities
- 4.3-inch color LCD display with graphical and numerical view modes
- Arbitrary waveform generation and digitizing from 10 microsecond intervals
- High throughput measurement with SCPI command support
- USB, LAN, GPIB, and digital I/O interfaces for flexible integration
Applications
- Optical device characterization (laser diodes, photodiodes)
- Organic device testing (OLEDs)
- Photovoltaic cell characterization
- Nano-technology material testing
- Power management device testing (LDOs, regulators)
- Semiconductor device characterization (FETs, transistors, diodes)
- Component testing and R&D applications
Specifications
| High Frequency (range) | DC <= 1kHz |
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Keysight B2911A Source Measure Unit