Keithley 2520 Pulsed Laser Diode Test System

Overview

The Keithley 2520 Pulsed Laser Diode Test System is an integrated, synchronized system designed for testing laser diodes early in the manufacturing process, before packaging or active temperature control is applied. It combines all sourcing and measurement capabilities needed for pulsed and continuous LIV (light-current-voltage) testing in one compact, half-rack instrument. The tight synchronization between source and measurement ensures high accuracy even with pulse widths as short as 500ns, making it ideal for in-process production testing of laser diodes at the chip or bar level.

Key Features

• Integrated solution for pulsed and continuous LIV testing of laser diodes
• Pulse capability up to 5A; DC capability up to 1A
• Programmable pulse on-time from 500ns to 5ms with up to 4% duty cycle
• 14-bit measurement accuracy on three measurement channels (VF, front photodiode, back photodiode)
• Synchronized DSP-based measurement channels for highly accurate light intensity and voltage measurements
• Up to 1000-point sweep stored in buffer memory to eliminate GPIB traffic during test
• Measurement algorithm increases pulse measurement signal-to-noise ratio
• Digital I/O binning and handling operations
• Sweep can be programmed to stop on optical power limit
• IEEE-488 and RS-232 interfaces

Applications

• Production testing of laser diodes at chip or bar level
• Early manufacturing quality assurance before packaging
• Optical power and electrical characterization of laser diodes
• Pulsed and DC testing of semiconductor optical sources

Included Accessories

• User Manual
• Quick Reference Guide
• Triax Cable (Qty 2)
• BNC 10W Coaxial Cables (Qty 4)