Keysight 4145A Semiconductor Parameter Analyzer

Overview

The Keysight 4145A is a stand-alone instrument designed for complete DC characterization of semiconductor devices and materials. It functions as both a stimulus source and measurement instrument, with programmable stimulus/measurement units that enable comprehensive device analysis. The built-in CRT display and graphic analysis tools allow real-time visualization and calculation of device parameters such as current gain (hFE) and transconductance (gm).

Key Features

• Four independent stimulus/measurement units (SMUs), each configurable as voltage source/current monitor or current source/voltage monitor
• Current range: 1 pA to 100 mA
• Voltage range: 1 mV to 100 V
• Built-in CRT display with user-selectable output formats (graph, list, matrix, schmoo)
• Programmable calculator for real-time parameter extraction
• Graphic analysis tools: marker, cursor, line function, interpolation
• Two voltage sources and two voltage monitors for multi-terminal device testing
• Flexible disc drive for program and result storage
• GPIB interface for external computer control

Applications

• Semiconductor device characterization
• Transistor parameter extraction (common-base, common-emitter, common-collector)
• Integrated circuit (IC) testing
• Production line quality control and device yield analysis
• Material property measurements