Hioki 3275 Wideband Current Probe

Overview

The Hioki 3275 is a wideband current probe designed for Memory HiCorders and high-performance oscilloscopes. It supports DC to 2 MHz bandwidth signals with 500 A continuous input. The probe combines proprietary thin-film Hall elements with the zero-flux method to deliver high-performance current measurement across a wide frequency range.

Key Features

• Wideband frequency response: DC to 2 MHz
• Maximum continuous current: 500 A
• Direct BNC connection to oscilloscope or Memory HiCorder
• Electrostatic shield reduces electric field interference
• Zero-flux method with Hall element detection for high S/N ratio
• Requires high input impedance instrument (1 MΩ or higher)

Technology

The 3275 uses a zero-flux method with proprietary thin-film Hall element detection. This measurement approach combines low operating magnetic flux level with low insertion impedance, minimizing influence on the measured object and reducing instrument loss. Hall element detection achieves high S/N ratio in the wideband range, making it particularly suitable for design verification of high-speed signal circuits.

Applications

• Power device waveform analysis
• High-voltage switching control equipment testing
• Inverter and motor current measurement
• Electronic circuit design verification