Tektronix BSA260C Bit Error Rate Tester
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Tektronix BSA260C Bit Error Rate Tester delivers high-speed pattern generation and error analysis up to 28.6 Gb/s with integrated eye diagram analysis.
Product details
| Model | BSA260C |
| Manufacturer | Tektronix |
| Category | Bit Error Rate Testing |
| Availability | Made to order |
Description
Overview
The Tektronix BSA260C BERTScope Bit Error Rate Tester provides comprehensive signal integrity measurements for serial data systems. It combines eye diagram analysis with BER pattern generation to enable rapid isolation of problematic bit and pattern sequences, then analyze further with advanced error analysis techniques.
Key Features
- Pattern generation and error analysis with high-speed BER measurements up to 28.6 Gb/s
- Fast input rise time and high input bandwidth error detector for accurate signal integrity analysis
- Integrated eye diagram analysis with BER correlation
- Patented Error Location Analysis™ for rapid understanding of BER performance limitations
- Comprehensive jitter decomposition including long pattern (PRBS-31) jitter analysis
- Integrated calibrated stress generation with sinusoidal jitter up to 100 MHz
- Physical layer test suite with mask testing, jitter peak, BER contour, and Q-factor analysis
- Support for standard jitter tolerance templates and user-defined libraries
Applications
- PCIe 2.0 & 3.0 receiver testing
- 10/40/100 Gb Ethernet electrical stressed eye testing
- Fibre channel (FC8, FC16, FC32) and IEEE 802.3ba testing
- SFP+/SFI, OIF/CEI, and InfiniBand (SDR, QDR, FDR, EDR) signal integrity analysis
- SATA, USB 3.1, and other serial data protocol testing
Specifications
| Maximum BER Speed | 28.6 Gb/s |
| Pattern Generation | Yes |
| Error Analysis Type | Bit error rate with error location analysis |
| Eye Diagram Analysis | Integrated with BER correlation |
| Jitter Analysis | Comprehensive decomposition with PRBS-31 support |
| Sinusoidal Jitter Range | 0 to 100 MHz |
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Tektronix BSA260C Bit Error Rate Tester
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